NotesFAQContact Us
Collection
Advanced
Search Tips
Back to results
Peer reviewed Peer reviewed
Direct linkDirect link
ERIC Number: EJ1143124
Record Type: Journal
Publication Date: 2017
Pages: 18
Abstractor: As Provided
ISBN: N/A
ISSN: ISSN-0022-0655
EISSN: N/A
A New Statistic for Detection of Aberrant Answer Changes
Sinharay, Sandip; Duong, Minh Q.; Wood, Scott W.
Journal of Educational Measurement, v54 n2 p200-217 Sum 2017
As noted by Fremer and Olson, analysis of answer changes is often used to investigate testing irregularities because the analysis is readily performed and has proven its value in practice. Researchers such as Belov, Sinharay and Johnson, van der Linden and Jeon, van der Linden and Lewis, and Wollack, Cohen, and Eckerly have suggested several statistics for detection of aberrant answer changes. This article suggests a new statistic that is based on the likelihood ratio test. An advantage of the new statistic is that it follows the standard normal distribution under the null hypothesis of no aberrant answer changes. It is demonstrated in a detailed simulation study that the Type I error rate of the new statistic is very close to the nominal level and the power of the new statistic is satisfactory in comparison to those of several existing statistics for detecting aberrant answer changes. The new statistic and several existing statistics were shown to provide useful information for a real data set. Given the increasing interest in analysis of answer changes, the new statistic promises to be useful to measurement practitioners.
Wiley-Blackwell. 350 Main Street, Malden, MA 02148. Tel: 800-835-6770; Tel: 781-388-8598; Fax: 781-388-8232; e-mail: cs-journals@wiley.com; Web site: http://www.wiley.com/WileyCDA
Publication Type: Journal Articles; Reports - Research
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A