ERIC Number: EJ735240
Record Type: Journal
Publication Date: 2005-Dec
Pages: 6
Abstractor: Author
ISBN: N/A
ISSN: ISSN-1040-3590
EISSN: N/A
Reliability and Validity of the Yale Global Tic Severity Scale
Storch, Eric A.; Murphy, Tanya K.; Geffken, Gary R.; Sajid, Muhammad; Allen, Pam; Roberti, Jonathan W.; Goodman, Wayne K.
Psychological Assessment, v17 n4 p486-491 Dec 2005
To investigate the reliability and validity of the Yale Global Tic Severity Scale (YGTSS), 28 youth aged 6 to 17 years with Tourette's syndrome (TS) participated in the study. Data included clinician reports of tics and obsessive-compulsive disorder (OCD) severity, parent reports of tics, internalizing and externalizing problems, and child reports of depression and anxiety. All children participated in a 2nd YGTSS administration by the same rater 48 days later. Good internal consistency and stability were found for the YGTSS scores. YGTSS scores demonstrated strong correlations with parent-rated tic severity (r = .58-.68). YGTSS scores were not significantly related to measures of clinician ratings of OCD severity (r = .01-.15), parent ratings of externalizing and internalizing behavior (r = -.07-.20), and child ratings of depression (r = .02-.26) and anxiety (r = -.06 -.28). Findings suggest that the YGTSS is a reliable and valid instrument for the assessment of pediatric TS.
Descriptors: Severity (of Disability), Measures (Individuals), Depression (Psychology), Anxiety, Test Validity, Test Reliability, Psychometrics, Measurement Techniques, Children, Adolescents, Psychological Patterns
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Publication Type: Journal Articles; Reports - Evaluative
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A