Descriptor
| Certification | 1 |
| Classification | 1 |
| Goodness of Fit | 1 |
| Item Response Theory | 1 |
| Licensing Examinations… | 1 |
| Scores | 1 |
| Test Items | 1 |
Source
| Journal of Educational… | 1 |
Author
| Meijer, Rob R. | 1 |
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| Journal Articles | 1 |
| Reports - Research | 1 |
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Peer reviewedMeijer, Rob R. – Journal of Educational Measurement, 2002
Used empirical data from a certification test to study methods from statistical process control that have been proposed to classify an item score pattern as fitting or misfitting the underlying item response theory model in computerized adaptive testing. Results for 1,392 examinees show that different types of misfit can be distinguished. (SLD)
Descriptors: Certification, Classification, Goodness of Fit, Item Response Theory
