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Cui, Zhongmin – Educational Measurement: Issues and Practice, 2021
Commonly used machine learning applications seem to relate to big data. This article provides a gentle review of machine learning and shows why machine learning can be applied to small data too. An example of applying machine learning to screen irregularity reports is presented. In the example, the support vector machine and multinomial naïve…
Descriptors: Artificial Intelligence, Man Machine Systems, Data, Bayesian Statistics
Marion, Scott; Domaleski, Chris – Educational Measurement: Issues and Practice, 2019
This article offers a critique of the validity argument put forward by Camara, Mattern, Croft, and Vispoel (2019) regarding the use of college-admissions tests in high school assessment systems. We challenge their argument in two main ways. First, we illustrate why their argument fails to address broader issues related to consequences of using…
Descriptors: College Entrance Examinations, High School Students, Test Use, Validity