ERIC Number: EJ1013023
Record Type: Journal
Publication Date: 2013-Mar
Pages: 3
Abstractor: As Provided
ISBN: N/A
ISSN: ISSN-0021-9584
EISSN: N/A
The Analog Atomic Force Microscope: Measuring, Modeling, and Graphing for Middle School
Goss, Valerie; Brandt, Sharon; Lieberman, Marya
Journal of Chemical Education, v90 n3 p358-360 Mar 2013
In this hands-on activity, students map the topography of a hidden surface
using an analog atomic force microscope (A-AFM) made from a cardboard box and mailing tubes. Varying numbers of ping pong balls inside the tubes mimic atoms on a surface. Students use a dowel to make macroscale measurements similar to those of a nanoscale AFM tip as it scans a surface during imaging, and then they build a three dimensional model of the hidden surface. This laboratory is targeted for middle school students, though it readily can be modified for grades K-12. (Contains 4 figures.)
Descriptors: Science Instruction, Chemistry, Secondary School Science, Middle Schools, Science Laboratories, Spectroscopy, Scientific Concepts, Molecular Structure, Measurement Techniques, Measurement Equipment, Hands on Science
Division of Chemical Education, Inc and ACS Publications Division of the American Chemical Society. 1155 Sixteenth Street NW, Washington, DC 20036. Tel: 800-227-5558; Tel: 202-872-4600; e-mail: eic@jce.acs.org; Web site: http://pubs.acs.org/jchemeduc
Publication Type: Journal Articles; Reports - Descriptive
Education Level: Middle Schools
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A