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ERIC Number: EJ1013023
Record Type: Journal
Publication Date: 2013-Mar
Pages: 3
Abstractor: As Provided
ISBN: N/A
ISSN: ISSN-0021-9584
EISSN: N/A
The Analog Atomic Force Microscope: Measuring, Modeling, and Graphing for Middle School
Goss, Valerie; Brandt, Sharon; Lieberman, Marya
Journal of Chemical Education, v90 n3 p358-360 Mar 2013
In this hands-on activity, students map the topography of a hidden surface using an analog atomic force microscope (A-AFM) made from a cardboard box and mailing tubes. Varying numbers of ping pong balls inside the tubes mimic atoms on a surface. Students use a dowel to make macroscale measurements similar to those of a nanoscale AFM tip as it scans a surface during imaging, and then they build a three dimensional model of the hidden surface. This laboratory is targeted for middle school students, though it readily can be modified for grades K-12. (Contains 4 figures.)
Division of Chemical Education, Inc and ACS Publications Division of the American Chemical Society. 1155 Sixteenth Street NW, Washington, DC 20036. Tel: 800-227-5558; Tel: 202-872-4600; e-mail: eic@jce.acs.org; Web site: http://pubs.acs.org/jchemeduc
Publication Type: Journal Articles; Reports - Descriptive
Education Level: Middle Schools
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A