ERIC Number: ED161335
Record Type: Non-Journal
Publication Date: 1978-May
Pages: 25
Abstractor: N/A
ISBN: N/A
ISSN: N/A
EISSN: N/A
Admissions-Yield and Persistence Analysis. AIR Forum Paper 1978.
Ramist, Leonard
Data from the college Board's Admissions Test Program (ATP) Summary Reports are used to analyze the student market attraction for ATP report designations, the application rate, the acceptance rate, the enrollment yield, and the dropout rate for 254 different student groups for 25l colleges. Student groups are defined in terms of their College Board test scores and self-reported high school record, socioeconomic characteristics, college plans, and skills and abilities. The results are aggregated by classifications based on the colleges' academic selectivity level, their size, and the proportions of their students that are from their state and their region. (Author)
Descriptors: Academic Ability, Achievement Rating, Cohort Analysis, College Admission, College Applicants, College Bound Students, College Choice, College Entrance Examinations, Demography, Dropout Rate, Educational Demand, Enrollment Rate, Grades (Scholastic), Higher Education, Institutional Characteristics, School Size, Socioeconomic Background, Statistical Data, Student Characteristics, Student Educational Objectives
Publication Type: Speeches/Meeting Papers
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A