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ERIC Number: EJ772402
Record Type: Journal
Publication Date: 2007
Pages: 41
Abstractor: Author
ISBN: N/A
ISSN: ISSN-1070-5511
EISSN: N/A
Sensitivity of Goodness of Fit Indexes to Lack of Measurement Invariance
Chen, Fang Fang
Structural Equation Modeling: A Multidisciplinary Journal, v14 n3 p464-504 2007
Two Monte Carlo studies were conducted to examine the sensitivity of goodness of fit indexes to lack of measurement invariance at 3 commonly tested levels: factor loadings, intercepts, and residual variances. Standardized root mean square residual (SRMR) appears to be more sensitive to lack of invariance in factor loadings than in intercepts or residual variances. Comparative fit index (CFI) and root mean square error of approximation (RMSEA) appear to be equally sensitive to all 3 types of lack of invariance. The most intriguing finding is that changes in fit statistics are affected by the interaction between the pattern of invariance and the proportion of invariant items: when the pattern of lack of invariance is uniform, the relation is nonmonotonic, whereas when the pattern of lack of invariance is mixed, the relation is monotonic. Unequal sample sizes affect changes across all 3 levels of invariance: Changes are bigger when sample sizes are equal rather than when they are unequal. Cutoff points for testing invariance at different levels are recommended.
Lawrence Erlbaum. Available from: Taylor & Francis, Ltd. 325 Chestnut Street Suite 800, Philadelphia, PA 19106. Tel: 800-354-1420; Fax: 215-625-2940; Web site: http://www.tandf.co.uk/journals/default.html
Publication Type: Journal Articles; Reports - Evaluative
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A