NotesFAQContact Us
Collection
Advanced
Search Tips
Back to results
Peer reviewed Peer reviewed
ERIC Number: EJ658128
Record Type: CIJE
Publication Date: 2002
Pages: N/A
Abstractor: N/A
ISBN: N/A
ISSN: ISSN-0002-9505
EISSN: N/A
Thin Lens Ray Tracing.
Gatland, Ian R.
American Journal of Physics, v70 n12 p1184-86 Dec 2002
Proposes a ray tracing approach to thin lens analysis based on a vector form of Snell's law for paraxial rays as an alternative to the usual approach in introductory physics courses. The ray tracing approach accommodates skew rays and thus provides a complete analysis. (Author/KHR)
Descriptors: Higher Education, Light, Optics, Physics, Science Education, Teaching Methods
Publication Type: Guides - Classroom - Teacher; Journal Articles
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A
Note: Contains 2002 Subject and Author Indexes.