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ERIC Number: ED217077
Record Type: Non-Journal
Publication Date: 1981
Pages: 41
Abstractor: N/A
ISBN: N/A
ISSN: N/A
EISSN: N/A
Detection of Item Bias Using Analyses of Response Patterns.
McArthur, David L.
Item bias, when present in a multiple-choice test, can be detected by appropriate analyses of the persons x items scoring matrix. Five related schemes for the statistical analysis of bias were applied to a widely used, primary skills multiple-choice test which was administered in either its English- or Spanish-language version at each of the two levels, to 1259 students in bilingual education programs. The results indicate that from one-fifth to one-third of the items in the tests show strong evidence of bias, corroborated by a separate analysis of linguistic and cultural sources of bias for both the biased items and those items with no statistical findings of bias. (Author)
Publication Type: Reports - Research
Education Level: N/A
Audience: N/A
Language: English
Sponsor: National Inst. of Education (ED), Washington, DC.
Authoring Institution: California Univ., Los Angeles. Center for the Study of Evaluation.
Identifiers - Assessments and Surveys: Comprehensive Tests of Basic Skills
Grant or Contract Numbers: N/A