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ERIC Number: ED175936
Record Type: RIE
Publication Date: 1979-Apr
Pages: 17
Abstractor: N/A
Reference Count: 0
Intelligence Testing in the Year 2000.
Turnbull, William W.
Reflections on past and future uses of intelligence tests are presented. Three current approaches to intelligence tests are described: (1) neural efficiency, which relates the speed or quality of functioning of the neural system to test results; (2) information processing--cognitive micro-processes used in solving test items; and (3) psychoeducational, which relates classroom phenomena and test content. In projecting the future of intelligence testing, suggestions are made to discard the term IQ; to use commonly understood words; and to label specific skills by the content being tested, such as "addition", rather than "quantitative skills." Predictions on the future of intelligence tests involve the reporting of separate scores, each of which reflects a distinct ability; use of a different standard of measurement, rather than the IQ ratio; and a reporting system which will have greater educational value. Measuring the development of separate skills rather than an aggregate is recommended, as well as constructing tests related to classroom instruction that are designed to measure specific skills as they develop over the years. Comparable tests of the same abilities which measure children's competencies in the dominant language, as well as in the language of instruction, are also recommended. (MH)
Publication Type: Speeches/Meeting Papers; Opinion Papers; Historical Materials
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Identifiers: N/A
Note: Paper presented at the Annual Meeting of the American Educational Research Association (63rd, San Francisco, California, April 8-12, 1979)