NotesFAQContact Us
Collection
Advanced
Search Tips
Back to results
Peer reviewed Peer reviewed
Direct linkDirect link
ERIC Number: EJ1175466
Record Type: Journal
Publication Date: 2018-Mar
Pages: 5
Abstractor: As Provided
Reference Count: 19
ISBN: N/A
ISSN: ISSN-1045-3830
Screening for Behavioral Risk: Identification of High Risk Cut Scores within the Social, Academic, and Emotional Behavior Risk Screener (SAEBRS)
Kilgus, Stephen P.; Taylor, Crystal N.; von der Embse, Nathaniel P.
School Psychology Quarterly, v33 n1 p155-159 Mar 2018
The purpose of this study was to support the identification of Social, Academic, and Emotional Behavior Risk Screener (SAEBRS) cut scores that could be used to detect high-risk students. Teachers rated students across two time points (Time 1 n = 1,242 students; Time 2 n = 704) using the SAEBRS and the Behavioral and Emotional Screening System (BESS), the latter of which served as the criterion measure. Exploratory receiver operating characteristic (ROC) curve analyses of Time 1 data detected cut scores evidencing optimal levels of specificity and borderline-to-optimal levels of sensitivity. Cross-validation analyses of Time 2 data confirmed the performance of these cut scores, with all but one scale evidencing similar performance. Findings are considered particularly promising for the SAEBRS Total Behavior scale in detecting high-risk students. Impacts and Implications: Schools are increasingly screening their students for social-emotional and behavioral difficulties. The results of the study indicate how the Social, Academic, and Emotional Behavior Risk Screener (SAEBRS) can be used to identify those students with the highest degree of need.
American Psychological Association. Journals Department, 750 First Street NE, Washington, DC 20002. Tel: 800-374-2721; Tel: 202-336-5510; Fax: 202-336-5502; e-mail: order@apa.org; Web site: http://www.apa.org
Publication Type: Journal Articles; Reports - Research
Education Level: Elementary Education
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A