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Garg, Amit; Sharma, Reena; Dhingra, Vishal – European Journal of Physics Education, 2010
In this paper, we report the development of an automated system for energy bandgap and resistivity measurement of a semiconductor sample using Four-Probe method for use in the undergraduate laboratory of Physics and Electronics students. The automated data acquisition and analysis system has been developed using National Instruments USB-6008 DAQ…
Descriptors: Undergraduate Study, College Science, Science Instruction, Physics