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Direct linkLiu, Yang; Maydeu-Olivares, Alberto – Educational and Psychological Measurement, 2013
Local dependence (LD) for binary IRT models can be diagnosed using Chen and Thissen's bivariate X[superscript 2] statistic and the score test statistics proposed by Glas and Suarez-Falcon, and Liu and Thissen. Alternatively, LD can be assessed using general purpose statistics such as bivariate residuals or Maydeu-Olivares and Joe's M[subscript r]…
Descriptors: Item Response Theory, Statistical Analysis, Models, Goodness of Fit
