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Huang, Hung-Yu; Wang, Wen-Chung – Educational and Psychological Measurement, 2013
Both testlet design and hierarchical latent traits are fairly common in educational and psychological measurements. This study aimed to develop a new class of higher order testlet response models that consider both local item dependence within testlets and a hierarchy of latent traits. Due to high dimensionality, the authors adopted the Bayesian…
Descriptors: Item Response Theory, Models, Bayesian Statistics, Computation
Bowden, Stephen C.; Saklofske, Donald H.; Weiss, Lawrence G. – Educational and Psychological Measurement, 2011
A measurement model describes both the numerical and theoretical relationship between observed scores and the corresponding latent variables or constructs. Testing a measurement model across groups is required to determine if the tests scores are tapping the same constructs so that the same meaning can be ascribed to the scores. Contemporary tests…
Descriptors: Intelligence, Construct Validity, Measurement, Measures (Individuals)
Bowden, Stephen C.; Lange, Rael T.; Weiss, Lawrence G.; Saklofske, Donald H. – Educational and Psychological Measurement, 2008
A measurement model is invoked whenever a psychological interpretation is placed on test scores. When stated in detail, a measurement model provides a description of the numerical and theoretical relationship between observed scores and the corresponding latent variables or constructs. In this way, the hypothesis that similar meaning can be…
Descriptors: Intelligence, Intelligence Tests, Measures (Individuals), Foreign Countries
Jeyakumar, Sharon L. E.; Warriner, Erin M.; Raval, Vaishali V.; Ahmad, Saadia A. – Educational and Psychological Measurement, 2004
Tables permitting the conversion of short-form composite scores to full-scale IQ estimates have been published for previous editions of the Wechsler Adult Intelligence Scale (WAIS). Equivalent tables are now needed for selected subtests of the WAIS-III. This article used Tellegen and Briggs's formulae to convert the sum of scaled scores for four…
Descriptors: Test Reliability, Intelligence Tests, Intelligence Quotient, Scores