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ERIC Number: EJ982329
Record Type: Journal
Publication Date: 2012-Oct
Pages: 8
Abstractor: As Provided
ISSN: ISSN-0013-1644
Nonconvergence/Improper Solution Problems with the Correlated-Trait Correlated-Method Parameterization of a Multitrait-Multimethod Matrix
Dumenci, Levent; Yates, Phillip D.
Educational and Psychological Measurement, v72 n5 p800-807 Oct 2012
Estimation problems associated with the correlated-trait correlated-method (CTCM) parameterization of a multitrait-multimethod (MTMM) matrix are widely documented: the model often fails to converge; even when convergence is achieved, one or more of the parameter estimates are outside the admissible parameter space. In this study, the authors explore the potential contributions of two factors to the occurrence of nonconvergence and inadmissible solutions: (a) the minimum number of indicators per factor and (b) the deviation of the MTMM matrix from the CTCM model beyond sampling variability. Analyses of two published occupational preference data sets involving six traits and five methods and a simulation study show that the probability of obtaining problematic solutions diminishes as the minimum number of indicators per factor increases. Also, isolating factors contributing to model misfit beyond sampling variability reduces the probability of obtaining problematic solutions by one half. The implications of these findings for choosing a measurement design that improves the probability of achieving a proper solution in the analysis of an MTMM matrix using the CTCM parameterization are discussed. (Contains 1 figure.)
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Publication Type: Journal Articles; Reports - Research
Education Level: Higher Education; Postsecondary Education
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Identifiers - Location: China; Hong Kong; United States
Identifiers - Assessments and Surveys: Self Directed Search