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van der Linden, Wim J. – Journal of Educational and Behavioral Statistics, 2008
Response times on items can be used to improve item selection in adaptive testing provided that a probabilistic model for their distribution is available. In this research, the author used a hierarchical modeling framework with separate first-level models for the responses and response times and a second-level model for the distribution of the…
Descriptors: Reaction Time, Law Schools, Adaptive Testing, Item Analysis
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van der Linden, Wim J.; Breithaupt, Krista; Chuah, Siang Chee; Zhang, Yanwei – Journal of Educational Measurement, 2007
A potential undesirable effect of multistage testing is differential speededness, which happens if some of the test takers run out of time because they receive subtests with items that are more time intensive than others. This article shows how a probabilistic response-time model can be used for estimating differences in time intensities and speed…
Descriptors: Adaptive Testing, Evaluation Methods, Test Items, Reaction Time
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Sotaridona, Leonardo S.; van der Linden, Wim J.; Meijer, Rob R. – Applied Psychological Measurement, 2006
A statistical test for detecting answer copying on multiple-choice tests based on Cohen's kappa is proposed. The test is free of any assumptions on the response processes of the examinees suspected of copying and having served as the source, except for the usual assumption that these processes are probabilistic. Because the asymptotic null and…
Descriptors: Cheating, Test Items, Simulation, Statistical Analysis
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van der Linden, Wim J. – Journal of Educational Statistics, 1978
Macready and Dayton introduced two probabilistic models for mastery assessment based on an idealistic all-or-none conception of mastery. Alternatively, an application of latent trait theory to mastery testing is proposed (a three parameter logistic model) as a more plausible model for test theory. (Author/CTM)
Descriptors: Criterion Referenced Tests, Guessing (Tests), Item Analysis, Latent Trait Theory
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van der Linden, Wim J.; Veldkamp, Bernard P. – Journal of Educational and Behavioral Statistics, 2004
Item-exposure control in computerized adaptive testing is implemented by imposing item-ineligibility constraints on the assembly process of the shadow tests. The method resembles Sympson and Hetter's (1985) method of item-exposure control in that the decisions to impose the constraints are probabilistic. The method does not, however, require…
Descriptors: Probability, Law Schools, Admission (School), Adaptive Testing
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van der Linden, Wim J. – Journal of Educational and Behavioral Statistics, 2003
The Hetter and Sympson (1997; 1985) method is a method of probabilistic item-exposure control in computerized adaptive testing. Setting its control parameters to admissible values requires an iterative process of computer simulations that has been found to be time consuming, particularly if the parameters have to be set conditional on a realistic…
Descriptors: Law Schools, Adaptive Testing, Admission (School), Computer Assisted Testing
van der Linden, Wim J.; Veldkamp, Bernard P. – 2002
Item-exposure control in computerized adaptive testing is implemented by imposing item-ineligibility constraints on the assembly process of the shadow tests. The method resembles J. Sympson and R. Hetter's (1985) method of item-exposure control in that the decisions to impose the constraints are probabilistic. However, the method does not require…
Descriptors: Adaptive Testing, College Entrance Examinations, Computer Assisted Testing, Law Schools
van der Linden, Wim J. – 2002
The Sympson and Hetter (SH; J. Sympson and R. Hetter; 1985; 1997) method is a method of probabilistic item exposure control in computerized adaptive testing. Setting its control parameters to admissible values requires an iterative process of computer simulations that has been found to be time consuming, particularly if the parameters have to be…
Descriptors: Adaptive Testing, College Entrance Examinations, Computer Assisted Testing, Law Schools
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Ariel, Adelaide; Veldkamp, Bernard P.; van der Linden, Wim J. – Journal of Educational Measurement, 2004
Preventing items in adaptive testing from being over- or underexposed is one of the main problems in computerized adaptive testing. Though the problem of overexposed items can be solved using a probabilistic item-exposure control method, such methods are unable to deal with the problem of underexposed items. Using a system of rotating item pools,…
Descriptors: Computer Assisted Testing, Adaptive Testing, Item Banks, Test Construction
Ariel, Adelaide; Veldkamp, Bernard P.; van der Linden, Wim J. – 2002
Preventing items in adaptive testing from being over- or underexposed is one of the main problems in computerized adaptive testing. Though the problem of overexposed items can be solved using a probabilistic item-exposure control method, such methods are unable to deal with the problem of underexposed items. Using a system of rotating item pools,…
Descriptors: Adaptive Testing, Computer Assisted Testing, Item Banks, Test Construction