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ERIC Number: EJ934380
Record Type: Journal
Publication Date: 2011-Jun
Pages: 11
Abstractor: As Provided
ISSN: ISSN-1040-3590
A Psychometric Analysis of the Positive and Negative Affect Schedule for Children-Parent Version in a School Sample
Ebesutani, Chad; Okamura, Kelsie; Higa-McMillan, Charmaine; Chorpita, Bruce F.
Psychological Assessment, v23 n2 p406-416 Jun 2011
The current study was the 1st to examine the psychometric properties of the Positive and Negative Affect Schedule for Children-Parent Version (PANAS-C-P) using a large school-based sample of children and adolescents ages 8 to 18 (N = 606). Confirmatory factor analysis supported a 2-factor (correlated) model of positive affect (PA) and negative affect (NA). The PANAS-C-P scale scores also demonstrated acceptable internal consistency and convergent and divergent validity. The PANAS-C-P PA and NA scale scores also related to measures of anxiety and depression in a manner consistent with the tripartite model. Scale means and standard deviations were reported by grade and sex to provide normative data for the PANAS-C-P scales. Results from the present study provide initial support for the PANAS-C-P as a parent-reported perspective of youth PA and NA among school-based youths. (Contains 4 tables and 4 footnotes.)
American Psychological Association. Journals Department, 750 First Street NE, Washington, DC 20002-4242. Tel: 800-374-2721; Tel: 202-336-5510; Fax: 202-336-5502; e-mail:; Web site:
Publication Type: Journal Articles; Reports - Evaluative
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Identifiers - Location: Hawaii
Grant or Contract Numbers: N/A