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ERIC Number: EJ853312
Record Type: Journal
Publication Date: 2009
Pages: 20
Abstractor: As Provided
Reference Count: 29
ISBN: N/A
ISSN: ISSN-0022-0655
Automated Test Assembly for Cognitive Diagnosis Models Using a Genetic Algorithm
Finkelman, Matthew; Kim, Wonsuk; Roussos, Louis A.
Journal of Educational Measurement, v46 n3 p273-292 Fall 2009
Much recent psychometric literature has focused on cognitive diagnosis models (CDMs), a promising class of instruments used to measure the strengths and weaknesses of examinees. This article introduces a genetic algorithm to perform automated test assembly alongside CDMs. The algorithm is flexible in that it can be applied whether the goal is to minimize the average number of classification errors, minimize the maximum error rate across all attributes being measured, hit a target set of error rates, or optimize any other prescribed objective function. Under multiple simulation conditions, the algorithm compared favorably with a standard method of automated test assembly, successfully finding solutions that were appropriate for each stated goal.
Wiley-Blackwell. 350 Main Street, Malden, MA 02148. Tel: 800-835-6770; Tel: 781-388-8598; Fax: 781-388-8232; e-mail: cs-journals@wiley.com; Web site: http://www.wiley.com/WileyCDA/
Publication Type: Journal Articles; Reports - Descriptive
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A