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ERIC Number: EJ1201667
Record Type: Journal
Publication Date: 2019
Pages: 46
Abstractor: As Provided
ISBN: N/A
ISSN: ISSN-0162-5748
EISSN: N/A
Investigating the Psychometric Properties of a New Survey Instrument Measuring Factors Related to Upward Transfer in STEM Fields
Wang, Xueli; Lee, Seo Young
Review of Higher Education, v42 n2 p339-384 Win 2019
We investigated the psychometric properties of six latent factors in a new survey instrument measuring factors related to transfer in STEM from 2-year to 4-year institutions: initial attitudes toward math, initial attitudes toward science, self-efficacy in math, self-efficacy in science, active learning, and transfer-oriented interaction. We demonstrated the utility of combining confirmatory factor analysis and item response theory in assessing both the overall factor structure and individual items' capability to capture respondent characteristics across all levels of a given latent trait. Our study expands the methodological repertoire for higher education survey research while illuminating potential mechanisms associated with transfer in STEM.
Johns Hopkins University Press. 2715 North Charles Street, Baltimore, MD 21218. Tel: 800-548-1784; Tel: 410-516-6987; Fax: 410-516-6968; e-mail: jlorder@jhupress.jhu.edu; Web site: http://www.press.jhu.edu/journals/subscribe.html
Publication Type: Journal Articles; Reports - Research
Education Level: Higher Education; Postsecondary Education; Two Year Colleges
Audience: N/A
Language: English
Sponsor: National Science Foundation (NSF)
Authoring Institution: N/A
Grant or Contract Numbers: DUE1430642