NotesFAQContact Us
Collection
Advanced
Search Tips
Peer reviewed Peer reviewed
Direct linkDirect link
ERIC Number: EJ970673
Record Type: Journal
Publication Date: 2012
Pages: 11
Abstractor: As Provided
Reference Count: 93
ISBN: N/A
ISSN: ISSN-0278-3193
History and Development of Above-Level Testing of the Gifted
Warne, Russell T.
Roeper Review, v34 n3 p183-193 2012
Above-level testing (also called "out-of-level testing," "off-grade testing," and "off-level testing") is the practice of administering a test level that was designed for and normed on an older population to a gifted child. This comprehensive literature review traces the practice of above-level testing from the earliest days of gifted education through the present. It was found that there were five reasons frequently given for above-level testing: raising the test ceiling, increasing score variability and discrimination, improving reliability, the sound interpretations of above-level test data, and reducing regression toward the mean. Although all of these reasons were theoretically supported, the strength of the empirical evidence varied. The article concludes by suggesting future directions of psychometric and applied research in above-level testing. (Contains 2 notes.)
Routledge. Available from: Taylor & Francis, Ltd. 325 Chestnut Street Suite 800, Philadelphia, PA 19106. Tel: 800-354-1420; Fax: 215-625-2940; Web site: http://www.tandf.co.uk/journals
Publication Type: Information Analyses; Journal Articles; Reports - Evaluative
Education Level: Elementary Secondary Education
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A