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ERIC Number: EJ960218
Record Type: Journal
Publication Date: 2012-May
Pages: 26
Abstractor: As Provided
Reference Count: 49
ISSN: ISSN-0011-0000
Self-Critical Perfectionism, Acculturative Stress, and Depression among International Students
Rice, Kenneth G.; Choi, Chun-Chung; Zhang, Yanmei; Morero, Yanina Ines; Anderson, Debra
Counseling Psychologist, v40 n4 p575-600 May 2012
The authors tested a classic diathesis-stress, stress-enhancement model of perfectionism with subgroups of Chinese (N = 129) and Asian Indian (N = 166) international graduate students attending a major U.S. university. More specifically, the authors tested whether self-critical perfectionism, acculturative stress, and their interaction accounted for different directions of effects and variability in depression. The authors found that self-critical perfectionism was positively associated with depression for both groups, but the effects were stronger for the Asian Indian students. In fact, only for Asian Indians was the Self-Critical Perfectionism x Acculturative Stress interaction significant, indicating worse depression for those students who were the most self-critical and most stressed. Potential differences in the importance of these predictors for subgroups of international students are discussed. Implications for intervention, prevention, and the need for further testing of these models in longitudinal studies are also addressed. (Contains 3 notes, 1 table, and 1 figure.)
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Publication Type: Journal Articles; Reports - Research
Education Level: Higher Education
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Identifiers - Location: United States