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ERIC Number: EJ934305
Record Type: Journal
Publication Date: 2011-May
Pages: 14
Abstractor: As Provided
Reference Count: 81
ISBN: N/A
ISSN: ISSN-0012-1649
Skin Conductance Level Reactivity Moderates the Association between Harsh Parenting and Growth in Child Externalizing Behavior
Erath, Stephen A.; El-Sheikh, Mona; Hinnant, J. Benjamin; Cummings, E. Mark
Developmental Psychology, v47 n3 p693-706 May 2011
Skin conductance level reactivity (SCLR) was examined as a moderator of the association between harsh parenting at age 8 years and growth in child externalizing behavior from age 8 to age 10 (N = 251). Mothers and fathers provided reports of harsh parenting and their children's externalizing behavior; children also provided reports of harsh parenting. SCLR was assessed in response to a socioemotional stress task and a problem-solving challenge task. Latent growth modeling revealed that boys with higher harsh parenting in conjunction with "lower" SCLR exhibited relatively high and stable levels of externalizing behavior during late childhood. Boys with higher harsh parenting and "higher" SCLR exhibited relatively low to moderate levels of externalizing behavior at age 8, but some results suggested that their externalizing behavior increased over time, approaching the same levels as boys with higher harsh parenting and lower SCLR by age 10. For the most part, girls and boys with lower harsh parenting were given relatively low and stable ratings of externalizing behavior throughout late childhood. Results are discussed from a developmental psychopathology perspective with reference to models of antisocial behavior in childhood. (Contains 4 tables, 2 footnotes and 3 figures.)
American Psychological Association. Journals Department, 750 First Street NE, Washington, DC 20002-4242. Tel: 800-374-2721; Tel: 202-336-5510; Fax: 202-336-5502; e-mail: order@apa.org; Web site: http://www.apa.org/publications
Publication Type: Journal Articles; Reports - Research
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A