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ERIC Number: EJ916197
Record Type: Journal
Publication Date: 2011-Feb
Pages: 8
Abstractor: As Provided
Reference Count: 19
ISBN: N/A
ISSN: ISSN-0018-9359
Understanding Optical Trapping Phenomena: A Simulation for Undergraduates
Mas, J.; Farre, A.; Cuadros, J.; Juvells, I.; Carnicer, A.
IEEE Transactions on Education, v54 n1 p133-140 Feb 2011
Optical trapping is an attractive and multidisciplinary topic that has become the center of attention to a large number of researchers. Moreover, it is a suitable subject for advanced students that requires a knowledge of a wide range of topics. As a result, it has been incorporated into some syllabuses of both undergraduate and graduate programs. In this paper, basic concepts in laser trapping theory are reviewed. To provide a better understanding of the underlying concepts for students, a Java application for simulating the behavior of a dielectric particle trapped in a highly focused beam has been developed. The program illustrates a wide range of theoretical results and features, such as the calculation of the force exerted by a beam in the Mie and Rayleigh regimes or the calibration of the trap stiffness. Some examples that are ready to be used in the classroom or in the computer lab are also supplied. (Contains 1 table and 10 figures.)
Institute of Electrical and Electronics Engineers, Inc. 445 Hoes Lane, Piscataway, NJ 08854. Tel: 732-981-0060; Web site: http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=13
Publication Type: Journal Articles; Reports - Descriptive
Education Level: Higher Education; Postsecondary Education
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Identifiers - Location: Spain (Barcelona)