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ERIC Number: EJ913314
Record Type: Journal
Publication Date: 2010-Mar
Pages: 2
Abstractor: As Provided
Reference Count: 5
ISBN: N/A
ISSN: ISSN-0021-9584
Coffee Cup Atomic Force Microscopy
Ashkenaz, David E.; Hall, W. Paige; Haynes, Christy L.; Hicks, Erin M.; McFarland, Adam D.; Sherry, Leif J.; Stuart, Douglas A.; Wheeler, Korin E.; Yonzon, Chanda R.; Zhao, Jing; Godwin, Hilary A.; Van Duyne, Richard P.
Journal of Chemical Education, v87 n3 p306-307 Mar 2010
In this activity, students use a model created from a coffee cup or cardstock cutout to explore the working principle of an atomic force microscope (AFM). Students manipulate a model of an AFM, using it to examine various objects to retrieve topographic data and then graph and interpret results. The students observe that movement of the AFM cantilever can be monitored by the deflection of a laser beam. Goals for the students are to examine macroscopic objects and relate their measurement technique to the atomic- and molecular-scale measurements of an actual AFM. (Contains 3 figures.)
Division of Chemical Education, Inc and ACS Publications Division of the American Chemical Society. 1155 Sixteenth Street NW, Washington, DC 20036. Tel: 800-227-5558; Tel: 202-872-4600; e-mail: eic@jce.acs.org; Web site: http://pubs.acs.org/jchemeduc
Publication Type: Journal Articles; Reports - Descriptive
Education Level: High Schools
Audience: Teachers
Language: English
Sponsor: N/A
Authoring Institution: N/A