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ERIC Number: EJ905551
Record Type: Journal
Publication Date: 2010-Nov
Pages: 10
Abstractor: As Provided
Reference Count: 26
ISBN: N/A
ISSN: ISSN-0018-9359
Industry-Oriented Laboratory Development for Mixed-Signal IC Test Education
Hu, J.; Haffner, M.; Yoder, S.; Scott, M.; Reehal, G.; Ismail, M.
IEEE Transactions on Education, v53 n4 p662-671 Nov 2010
The semiconductor industry is lacking qualified integrated circuit (IC) test engineers to serve in the field of mixed-signal electronics. The absence of mixed-signal IC test education at the collegiate level is cited as one of the main sources for this problem. In response to this situation, the Department of Electrical and Computer Engineering at the Ohio State University, Columbus, has partnered with Texas Instruments to establish an IC test-engineering-oriented course. The course objectives are to familiarize students with industrial testing techniques and to help students obtain the fundamental skill sets required to be competent mixed-signal IC test engineers. A novel laboratory pedagogy is developed to achieve these objectives. The results of the classroom assignments and the feedback provided by students, faculty, and industry representatives indicate that the approach has successfully achieved these goals. (Contains 8 figures and 8 tables.)
Institute of Electrical and Electronics Engineers, Inc. 445 Hoes Lane, Piscataway, NJ 08854. Tel: 732-981-0060; Web site: http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=13
Publication Type: Journal Articles; Reports - Descriptive
Education Level: N/A
Audience: Students; Teachers
Language: English
Sponsor: N/A
Authoring Institution: N/A
Identifiers - Location: Ohio