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ERIC Number: EJ900587
Record Type: Journal
Publication Date: 2010-May
Pages: 7
Abstractor: As Provided
Reference Count: 3
ISBN: N/A
ISSN: ISSN-0018-9359
A Cost-Effective Atomic Force Microscope for Undergraduate Control Laboratories
Jones, C. N.; Goncalves, J.
IEEE Transactions on Education, v53 n2 p328-334 May 2010
This paper presents a simple, cost-effective and robust atomic force microscope (AFM), which has been purposely designed and built for use as a teaching aid in undergraduate controls labs. The guiding design principle is to have all components be open and visible to the students, so the inner functioning of the microscope has been made clear to see. All of the parts but one are off the shelf, and assembly time is generally less than two days, which makes the microscope a robust instrument that is readily handled by the students with little chance of damage. While the scanning resolution is nowhere near that of a commercial instrument, it is more than sufficient to take interesting scans of micrometer-scale objects. A survey of students after their having used the AFM resulted in a generally good response, with 80% agreeing that they had a positive learning experience. (Contains 8 figures, 3 tables, and 3 footnotes.)
Institute of Electrical and Electronics Engineers, Inc. 445 Hoes Lane, Piscataway, NJ 08854. Tel: 732-981-0060; Web site: http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=13
Publication Type: Journal Articles; Reports - Evaluative
Education Level: Higher Education
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A