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ERIC Number: EJ879659
Record Type: Journal
Publication Date: 2008
Pages: 26
Abstractor: As Provided
Reference Count: 24
ISSN: ISSN-1076-9986
An Additional Measure of Overall Effect Size for Logistic Regression Models
Allen, Jeff; Le, Huy
Journal of Educational and Behavioral Statistics, v33 n4 p416-441 2008
Users of logistic regression models often need to describe the overall predictive strength, or effect size, of the model's predictors. Analogs of R[superscript 2] have been developed, but none of these measures are interpretable on the same scale as effects of individual predictors. Furthermore, R[superscript 2] analogs are not invariant to the base rate (overall proportion of successes), making it difficult to compare effect sizes across data sets. The authors propose a measure of overall effect size that is interpretable on the same scale as effects of individual predictors and is invariant to the base rate. They explore the properties of the overall odds ratio and illustrate its use through an example. They also provide interpretive guidance and illustrate how statistical software can be used to compute the proposed measure. (Contains 5 tables and 3 figures.)
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Publication Type: Journal Articles; Reports - Research
Education Level: Higher Education; Postsecondary Education
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A