NotesFAQContact Us
Search Tips
Peer reviewed Peer reviewed
Direct linkDirect link
ERIC Number: EJ878528
Record Type: Journal
Publication Date: 2010-Mar
Pages: 15
Abstractor: As Provided
Reference Count: 61
ISSN: ISSN-0278-7393
Relationship between Measures of Working Memory Capacity and the Time Course of Short-Term Memory Retrieval and Interference Resolution
Oztekin, Ilke; McElree, Brian
Journal of Experimental Psychology: Learning, Memory, and Cognition, v36 n2 p383-397 Mar 2010
The response-signal speed-accuracy trade-off (SAT) procedure was used to investigate the relationship between measures of working memory capacity and the time course of short-term item recognition. High- and low-span participants studied sequentially presented 6-item lists, immediately followed by a recognition probe. Analyses of composite list and serial position SAT functions found no differences in retrieval speed between the 2 span groups. Overall accuracy was higher for high spans than low spans, with more pronounced differences for earlier serial positions. Analysis of false alarms to recent negatives (lures from the previous study list) revealed no differences in the timing or magnitude of early false alarms, thought to reflect familiarity-based judgments. However, analyses of false alarms later in retrieval indicated that recollective information accrues more slowly for low spans, which suggests that recollective information may also contribute less to judgments concerning studied items for low-span participants. These findings can provide an explanation for the greater susceptibility of low spans to interference. (Contains 6 tables, 7 figures, and 3 footnotes.)
American Psychological Association. Journals Department, 750 First Street NE, Washington, DC 20002-4242. Tel: 800-374-2721; Tel: 202-336-5510; Fax: 202-336-5502; e-mail:; Web site:
Publication Type: Journal Articles; Reports - Research
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Identifiers - Assessments and Surveys: SAT (College Admission Test)