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ERIC Number: EJ876727
Record Type: Journal
Publication Date: 2010
Pages: 17
Abstractor: As Provided
Reference Count: 29
ISBN: N/A
ISSN: ISSN-0013-1644
The Internal Structure of Positive and Negative Affect: A Confirmatory Factor Analysis of the PANAS
Tuccitto, Daniel E.; Giacobbi, Peter R., Jr.; Leite, Walter L.
Educational and Psychological Measurement, v70 n1 p125-141 2010
This study tested five confirmatory factor analytic (CFA) models of the Positive Affect Negative Affect Schedule (PANAS) to provide validity evidence based on its internal structure. A sample of 223 club sport athletes indicated their emotions during the past week. Results revealed that an orthogonal two-factor CFA model, specifying error correlations according to Zevon and Tellegen's mood content categories, provided the best fit to our data. In addition, parameter estimates for this model suggest that PANAS scores are reliable and explain large proportions of item variance. Taken together with previous research, the findings further suggest that the PANAS may be a higher-order measure of affect and includes several consistently problematic items. The authors recommend that affect researchers attempt to improve the PANAS by (a) revising consistently problematic items, (b) adding new items to better capture mood content categories, and (c) providing additional internal structure validity evidence through a diagonally weighted least squares estimation of a second-order PANAS CFA model. (Contains 1 table and 1 figure.)
SAGE Publications. 2455 Teller Road, Thousand Oaks, CA 91320. Tel: 800-818-7243; Tel: 805-499-9774; Fax: 800-583-2665; e-mail: journals@sagepub.com; Web site: http://sagepub.com
Publication Type: Journal Articles; Reports - Research
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A