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ERIC Number: EJ876708
Record Type: Journal
Publication Date: 2010
Pages: 13
Abstractor: As Provided
Reference Count: 30
ISSN: ISSN-0022-0655
A Note on the Invariance of the DINA Model Parameters
de la Torre, Jimmy; Lee, Young-Sun
Journal of Educational Measurement, v47 n1 p115-127 Spr 2010
Cognitive diagnosis models (CDMs), as alternative approaches to unidimensional item response models, have received increasing attention in recent years. CDMs are developed for the purpose of identifying the mastery or nonmastery of multiple fine-grained attributes or skills required for solving problems in a domain. For CDMs to receive wider use, researchers and practitioners need to understand the basic properties of these models. The article focuses on one CDM, the deterministic inputs, noisy "and" gate (DINA) model, and the invariance property of its parameters. Using simulated data involving different attribute distributions, the article demonstrates that the DINA model parameters are absolutely invariant when the model perfectly fits the data. An additional example involving different ability groups illustrates how noise in real data can contribute to the lack of invariance in these parameters. Some practical implications of these findings are discussed.
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Publication Type: Journal Articles; Reports - Descriptive
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A