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ERIC Number: EJ860668
Record Type: Journal
Publication Date: 2009-Nov
Pages: 6
Abstractor: As Provided
Reference Count: 1
ISBN: N/A
ISSN: ISSN-0143-0807
Measuring Slit Width and Separation in a Diffraction Experiment
Gan, K. K.; Law, A. T.
European Journal of Physics, v30 n6 p1271-1276 Nov 2009
We present a procedure for measuring slit width and separation in single- and double-slit diffraction experiments. Intensity spectra of diffracted laser light are measured with an optical sensor (PIN diode). Slit widths and separations are extracted by fitting to the measured spectra. We present a simple fitting procedure to account for the integration (averaging) of light across the finite sensor aperture. This experiment provides students with a quantitative, in-depth verification of diffraction theory, as well as hands-on experience in sophisticated fitting methods. (Contains 1 footnote and 4 figures.)
Institute of Physics Publishing. The Public Ledger Building Suite 929, 150 South Independence Mall West, Philadelphia, PA 19106. Tel: 215-627-0880; Fax: 215-627-0879; e-mail: info@ioppubusa.com; Web site: http://www.iop.org/EJ/journal/EJP
Publication Type: Journal Articles; Reports - Descriptive
Education Level: Higher Education; Postsecondary Education
Audience: Teachers
Language: English
Sponsor: N/A
Authoring Institution: N/A