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ERIC Number: EJ853314
Record Type: Journal
Publication Date: 2009
Pages: 21
Abstractor: As Provided
Reference Count: 23
ISBN: N/A
ISSN: ISSN-0022-0655
Reliability and Attribute-Based Scoring in Cognitive Diagnostic Assessment
Gierl, Mark J.; Cui, Ying; Zhou, Jiawen
Journal of Educational Measurement, v46 n3 p293-313 Fall 2009
The attribute hierarchy method (AHM) is a psychometric procedure for classifying examinees' test item responses into a set of structured attribute patterns associated with different components from a cognitive model of task performance. Results from an AHM analysis yield information on examinees' cognitive strengths and weaknesses. Hence, the AHM can be used for cognitive diagnostic assessment. The purpose of this study is to introduce and evaluate a new concept for assessing attribute reliability using the ratio of true score variance to observed score variance on items that probe specific cognitive attributes. This reliability procedure is evaluated and illustrated using both simulated data and student response data from a sample of algebra items taken from the March 2005 administration of the SAT. The reliability of diagnostic scores and the implications for practice are also discussed.
Wiley-Blackwell. 350 Main Street, Malden, MA 02148. Tel: 800-835-6770; Tel: 781-388-8598; Fax: 781-388-8232; e-mail: cs-journals@wiley.com; Web site: http://www.wiley.com/WileyCDA/
Publication Type: Journal Articles; Reports - Evaluative
Education Level: Elementary Secondary Education; Secondary Education
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Identifiers - Assessments and Surveys: SAT (College Admission Test)