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ERIC Number: EJ850581
Record Type: Journal
Publication Date: 2009-Sep
Pages: 11
Abstractor: As Provided
Reference Count: N/A
ISBN: N/A
ISSN: ISSN-1598-1037
Examining Type I Error and Power for Detection of Differential Item and Testlet Functioning
Lee, Young-Sun; Cohen, Allan; Toro, Maritsa
Asia Pacific Education Review, v10 n3 p365-375 Sep 2009
In this study, the effectiveness of detection of differential item functioning (DIF) and testlet DIF using SIBTEST and Poly-SIBTEST were examined in tests composed of testlets. An example using data from a reading comprehension test showed that results from SIBTEST and Poly-SIBTEST were not completely consistent in the detection of DIF and testlet DIF. Results from a simulation study indicated that SIBTEST appeared to maintain type I error control for most conditions, except in some instances in which the magnitude of simulated DIF tended to increase. This same pattern was present for the Poly-SIBTEST results, although Poly-SIBTEST demonstrated markedly less control of type I errors. Type I error control with Poly-SIBTEST was lower for those conditions for which the ability was unmatched to test difficulty. The power results for SIBTEST were not adversely affected, when the size and percent of simulated DIF increased. Although Poly-SIBTEST failed to control type I errors in over 85% of the conditions simulated, in those conditions for which type I error control was maintained, Poly-SIBTEST demonstrated higher power than SIBTEST.
Springer. 233 Spring Street, New York, NY 10013. Tel: 800-777-4643; Tel: 212-460-1500; Fax: 212-348-4505; e-mail: service-ny@springer.com; Web site: http://www.springerlink.com
Publication Type: Journal Articles; Reports - Evaluative
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A