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ERIC Number: EJ848935
Record Type: Journal
Publication Date: 2009-May
Pages: 4
Abstractor: As Provided
Reference Count: 10
ISBN: N/A
ISSN: ISSN-0031-9120
Learning about Modes in Atomic Force Microscopy by Means of Hands-On Activities Based on a Simple Apparatus
Phuapaiboon, Unchada; Panijpan, Bhinyo; Osotchan, Tanakorn
Physics Education, v44 n3 p306-309 May 2009
This study was conducted to examine the results of using a low-cost hands-on setup in combination with accompanying activities to promote understanding of the contact mode of atomic force microscopy (AFM). This contact mode setup enabled learners to study how AFM works by hand scanning using probing cantilevers with different characteristics on two types of artificial surface. They also learnt how to select the various probing cantilevers on the basis of their understanding of the advantages and disadvantages of using them. (Contains 1 table and 2 figures.)
Institute of Physics Publishing. The Public Ledger Building Suite 929, 150 South Independence Mall West, Philadelphia, PA 19106. Tel: 215-627-0880; Fax: 215-627-0879; e-mail: info@ioppubusa.com; Web site: http://journals.iop.org
Publication Type: Journal Articles; Reports - Research
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A