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ERIC Number: EJ789817
Record Type: Journal
Publication Date: 2008-May
Pages: 12
Abstractor: Author
ISBN: N/A
ISSN: ISSN-1470-3297
EISSN: N/A
Analysing Users' Satisfaction with E-Learning Using a Negative Critical Incidents Approach
Chen, Nian-Shing; Lin, Kan-Min; Kinshuk
Innovations in Education and Teaching International, v45 n2 p115-126 May 2008
One critical success factor for e-learning is learners' satisfaction with it. This is affected by both positive and negative experiences in a learning process. This paper examines the impact of such critical incidents on learners' satisfaction in e-learning. In particular, frequent occurrence of negative critical incidents has significant potential of negatively affecting satisfaction. The focus of this paper is on assessing satisfaction with e-learning from a "negative critical incidents" perspective. The paper describes a satisfaction assessment model, called SAFE. The results of an empirical study at the National Sun Yat-sen Cyber-University are used to evaluate and validate the SAFE model. Based on the results, the critical incidents that affect e-learning satisfaction are classified into four categories: administration, functionality, instruction and interaction. Of these, interaction and instruction are found to be the most important factors. (Contains 2 figures and 3 tables.)
Routledge. Available from: Taylor & Francis, Ltd. 325 Chestnut Street Suite 800, Philadelphia, PA 19106. Tel: 800-354-1420; Fax: 215-625-2940; Web site: http://www.tandf.co.uk/journals/default.html
Publication Type: Journal Articles; Reports - Research
Education Level: Higher Education
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A