ERIC Number: EJ768275
Record Type: Journal
Publication Date: 2007-Jul
Reference Count: N/A
Testing a Conceptual Model of Working through Self-Defeating Patterns
Wei, Meifen; Ku, Tsun-Yao
Journal of Counseling Psychology, v54 n3 p295-305 Jul 2007
The present study developed and examined a conceptual model of working through self-defeating patterns. Participants were 390 college students at a large midwestern university. Results indicated that self-defeating patterns mediated the relations between attachment and distress. Also, self-esteem mediated the link between self-defeating patterns and depression, whereas social self-efficacy mediated the association between self-defeating patterns and interpersonal distress. A total of 33% of the variance in self-defeating patterns was explained by attachment anxiety and avoidance; 39% of the variance in self-esteem and 13% of the variance in social self-efficacy were explained by self-defeating patterns and/or attachment anxiety; 50% of the variance in depression was explained by attachment anxiety, self-defeating patterns, and self-esteem; 45% of the variance in interpersonal distress was explained by attachment anxiety and avoidance, self-defeating patterns, and social self-efficacy.
Descriptors: Self Efficacy, Depression (Psychology), Failure, College Students, Self Esteem, Low Achievement, Attachment Behavior, Anxiety, Behavior Patterns, Interpersonal Competence, Models
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Publication Type: Journal Articles; Reports - Research
Education Level: N/A
Authoring Institution: American Psychological Association, Washington, DC.