ERIC Number: EJ662110
Record Type: Journal
Publication Date: 2002
Reference Count: N/A
Understand Rasch Measurement: Construction of Measures from Many-facet Data.
Linacre, John M.; Wright, Benjamin D.
Journal of Applied Measurement, v3 n4 p486-512 2002
Describes an extension to the Rasch model for fundamental measurement in which there is parameterization not only for examinee ability and item difficulty but also for judge severity. Discusses variants of this model and judging plans, and explains its use in an empirical testing situation. (SLD)
Publication Type: Journal Articles; Reports - Descriptive
Education Level: N/A
Authoring Institution: N/A