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ERIC Number: EJ656645
Record Type: Journal
Publication Date: 2000
Pages: N/A
Abstractor: N/A
Reference Count: N/A
ISSN: ISSN-1529-7713
Understanding Rasch Measurement: Rasch Models Overview.
Wright, Benjamin D.; Mok, Magdalena
Journal of Applied Measurement, v1 n1 p83-106 2000
Presents an overview of Rasch measurement models that begins with a conceptualization of continuous experiences often captured as discrete observations. Discusses the mathematical properties of the Rasch family of models that allow the transformation of discrete deterministic counts into continuous probabilistic abstractions. Also discusses six of the family of Rasch models and the types of data for which these are appropriate. (SLD)
Publication Type: Information Analyses; Journal Articles
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A