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ERIC Number: EJ642273
Record Type: Journal
Publication Date: 2001
Pages: N/A
Abstractor: N/A
Reference Count: N/A
ISSN: ISSN-0895-7347
Evaluating Type I Error and Power Rates Using an Effect Size Measure with the Logistic Regression Procedure for DIF Detection.
Jodoin, Michael G.; Gierl, Mark J.
Applied Measurement in Education, v14 n4 p329-49 2001
Developed a new classification method for the logistic regression (LR) procedure for differential item functioning (DIF) based on methods used in the Simultaneous Item Bias test and conducted a simulation study to determine if the effect size measure affects the Type I error and power rates for the LR DIF procedure. Results show that inclusion of the effect size measure can reduce Type I error rates. (SLD)
Publication Type: Journal Articles; Reports - Evaluative
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A