Peer reviewedERIC Number: EJ628794
Record Type: Journal
Publication Date: 2001
Pages: N/A
Abstractor: N/A
ISBN: N/A
ISSN: ISSN-0033-3123
EISSN: N/A
On Maximizing Item Information and Matching Difficulty with Ability.
Bickel, Peter; Buyske, Steven; Chang, Huahua; Ying, Zhiliang
Psychometrika, v66 n1 p69-77 Mar 2001
Examined the assumption that matching difficulty levels of test items with an examinee's ability makes a test more efficient and challenged this assumption through a class of one-parameter item response theory models. Found the validity of the fundamental assumption to be closely related to the van Zwet tail ordering of symmetric distributions (W. van Zwet, 1964). (SLD)
Descriptors: Ability, Difficulty Level, Item Response Theory, Test Construction, Test Items, Validity
Publication Type: Journal Articles; Reports - Evaluative
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A
