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ERIC Number: EJ615868
Record Type: Journal
Publication Date: 2000
Pages: N/A
Abstractor: N/A
Reference Count: N/A
ISBN: N/A
ISSN: ISSN-1076-9986
Univariate and Bivariate Loglinear Models for Discrete Test Score Distributions.
Holland, Paul W.; Thayer, Dorothy T.
Journal of Educational and Behavioral Statistics, v25 n2 p133-83 Sum 2000
Applied the theory of exponential families of distributions to the problem of fitting the univariate histograms and discrete bivariate frequency distributions that often arise in the analysis of test scores. Considers efficient computation of the maximum likelihood estimates of the parameters using Newton's Method and computationally efficient ways of obtaining the asymptotic standard errors of the fitted frequencies and proportions. (SLD)
Publication Type: Journal Articles; Reports - Evaluative
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A