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ERIC Number: EJ605892
Record Type: Journal
Publication Date: 1999
Pages: N/A
Abstractor: N/A
Reference Count: N/A
ISBN: N/A
ISSN: ISSN-1076-9986
F Tests for Mean and Covariance Structure Analysis.
Yuan, Ke-Hai; Bentler, Peter M.
Journal of Educational and Behavioral Statistics, v24 n3 p225-43 Fall 1999
Proposed some modified asymptotic distribution free (ADF) test statistics with distributions that are approximated by F distributions. Empirical studies show that the distributions of the new statistics are more closely approximated by F distributions than are the original ADF statistics when referred to chi-square distributions. (SLD)
Publication Type: Journal Articles; Reports - Descriptive; Speeches/Meeting Papers
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A