ERIC Number: EJ594322
Record Type: Journal
Publication Date: 1998
Reference Count: N/A
A Model for Optimal Constrained Adaptive Testing.
van der Linden, Wim J.; Reese, Lynda M.
Applied Psychological Measurement, v22 n3 p259-70 Sep 1998
Proposes a model for constrained computerized adaptive testing in which the information in the test at the trait level (theta) estimate is maximized subject to the number of possible constraints on the content of the test. Test assembly relies on a linear-programming approach. Illustrates the approach through simulation with items from the Law School Admission Test. (SLD)
Publication Type: Journal Articles; Reports - Descriptive
Education Level: N/A
Authoring Institution: N/A
Identifiers - Assessments and Surveys: Law School Admission Test