ERIC Number: EJ594319
Record Type: Journal
Publication Date: 1998
Reference Count: N/A
Computer-Assisted Test Assembly Using Optimization Heuristics.
Leucht, Richard M.
Applied Psychological Measurement, v22 n3 p224-36 Sep 1998
Presents a variation of a "greedy" algorithm that can be used in test-assembly problems. The algorithm, the normalized weighted absolute-deviation heuristic, selects items to have a locally optimal fit to a moving set of average criterion values. Demonstrates application of the model. (SLD)
Publication Type: Journal Articles; Reports - Descriptive
Education Level: N/A
Authoring Institution: N/A