ERIC Number: EJ594318
Record Type: Journal
Publication Date: 1998
Reference Count: N/A
Parallel Test Construction Using Classical Item Parameters.
Sanders, Piet F.; Verschoor, Alfred J.
Applied Psychological Measurement, v22 n3 p212-23 Sep 1998
Presents minimization and maximization models for parallel test construction under constraints. The minimization model constructs weakly and strongly parallel tests of minimum length, while the maximization model constructs weakly and strongly parallel tests with maximum test reliability. (Author/SLD)
Publication Type: Journal Articles; Reports - Descriptive
Education Level: N/A
Authoring Institution: N/A