NotesFAQContact Us
Collection
Advanced
Search Tips
Peer reviewed Peer reviewed
ERIC Number: EJ594317
Record Type: Journal
Publication Date: 1998
Pages: N/A
Abstractor: N/A
Reference Count: N/A
ISBN: N/A
ISSN: ISSN-0146-6216
Optimal Assembly of Psychological and Educational Tests.
van der Linden, Wim J.
Applied Psychological Measurement, v22 n3 p195-211 Sep 1998
Reviews optimal test-assembly literature and introduces the contributions to this special issue. Discusses four approaches to computerized test assembly: (1) heuristic-based test assembly; (2) 0-1 linear programming; (3) network-flow programming; and (4) an optimal design approach. Contains a bibliography of 90 sources on test assembly. (Author/SLD)
Publication Type: Information Analyses; Journal Articles
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A