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ERIC Number: EJ582926
Record Type: Journal
Publication Date: 1998
Pages: N/A
Abstractor: N/A
Reference Count: N/A
ISBN: N/A
ISSN: ISSN-1076-9986
Improved Type I Error Control and Reduced Estimation Bias for DIF Detection Using SIBTEST.
Jiang, Hai; Stout, William
Journal of Educational and Behavioral Statistics, v23 n4 p291-322 Win 1998
Proposes a new regression correction for the SIBTEST statistical tests (R. Shealy and W. Stout, 1993) that essentially uses a two-segment piecewise linear regression of the true on observed matching subtest scores. A simulation study illustrates the approach. (SLD)
Publication Type: Journal Articles; Reports - Descriptive
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A