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ERIC Number: EJ509676
Record Type: Journal
Publication Date: 1995
Pages: N/A
Abstractor: N/A
Reference Count: N/A
ISSN: ISSN-0033-3085
Stability Reliability for Elementary-Age Students on the Woodcock-Johnson Psychoeducational Battery-Revised (Achievement Section) and the Kaufman Test of Educational Achievement.
Shull-Senn, Shannon; And Others
Psychology in the Schools, v32 n2 p86-92 Apr 1995
Examines the stability reliability for the Woodcock-Johnson-Revised (WJ-R) and the Kaufman Test of Educational Achievement with approximately a two-week retest interval. Results indicate that across grade levels, the Broad Reading Cluster for the WJ-R remained the same. Most correlations for the clusters for mathematics and written language were less than .90. More specific information in test manuals on test-retest reliability is called for. (JPS)
Publication Type: Reports - Research; Journal Articles
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Identifiers - Assessments and Surveys: Kaufman Test of Educational Achievement; Woodcock Johnson Psycho Educational Battery