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ERIC Number: EJ483409
Record Type: Journal
Publication Date: 1994
Pages: N/A
Abstractor: N/A
Reference Count: N/A
ISBN: N/A
ISSN: ISSN-0740-7874
School-by-School Test Score Comparisons: Statistical Issues and Pitfalls.
Rafferty, Eileen A.; Treff, August V.
ERS Spectrum, v12 n2 p16-19 Spr 1994
Addresses issues faced by institutions attempting to design school profiles to meet accountability standards. Reports of high-stakes test results can be skewed by choice of statistic type (percent of students passing versus mean scores), sample bias, geographical transients, and omission errors. Administrators must look beyond "common sense" success indicators to construct school profiles that fairly reflect disparate populations. (MLH)
Publication Type: Reports - Evaluative; Journal Articles
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A