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ERIC Number: EJ401715
Record Type: CIJE
Publication Date: 1989
Pages: N/A
Abstractor: N/A
ISBN: N/A
ISSN: N/A
EISSN: N/A
Using Item-Specific Instructional Information in Achievement Modeling.
Muthen, Bengt O.
Psychometrika, v54 n3 p385-96 Sep 1989
A method for detecting instructional sensitivity (item bias) in test items is proposed. This method extends item response theory by allowing for item-specific variation in measurement relations across students' varying instructional backgrounds. Item bias detection is a by-product. Traditional and new methods are compared. (SLD)
Descriptors: Achievement Tests, Educational Background, Educational Opportunities, Elementary Secondary Education, Equations (Mathematics), Evaluation Methods, Mathematical Models, Test Bias, Test Items
Publication Type: Journal Articles; Reports - Evaluative; Speeches/Meeting Papers
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A
Note: Paper presented at the Annual Meeting of the American Educational Research Association (Washington, DC, April 20-24, 1987).